LAB FOR CUSTOM RF MEASUREMENTS

Cover Sistemi has a laboratory for testing of the designed systems.

  • Real-time oscilloscope up to 4.5GHz and 25G samples
    – Signals and waveform conformity to design specs
    – Eye-diagrams of high-speed signals
    – Spurious and noise analysis on power supply
    – Custom elaboration of acquired waveforms (Octave / C / C++)
    – acquisition and analysis of non-repetitive events
  • Sampling oscilloscope up to 20GHz
    – Eye-diagrams of high-speed signals
    – TDR measurements of 2-ports devices
    – Xtalk measurements, line impedances
  • Spectrum analyzer up to 8GHz
    – Channel power measurements
    – In-band and out-of-band spurious measurements
    – Spectral conformity with respect to  limit-emission spectral masks

Coding of programs for automatic acquisitions and measurements, acquisition of signals from different domain, post-measurement elaboration and statistical analysis

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