LAB FOR CUSTOM RF MEASUREMENTS

Cover Sistemi has a laboratory for testing of the designed systems.

• Real-time oscilloscope up to 4.5GHz and 25G samples
  – Signals and waveform conformity to design specs
  – Eye-diagrams of high-speed signals
  – Spurious and noise analysis on power supply
  – Custom elaboration of acquired waveforms (Octave / C / C++)
  – acquisition and analysis of non-repetitive events

• Sampling oscilloscope up to 20GHz
  – Eye-diagrams of high-speed signals
  – TDR measurements of 2-ports devices
  – Xtalk measurements, line impedances

• Spectrum analyzer up to 8GHz
  – Channel power measurements
  – In-band and out-of-band spurious measurements
  – Spectral conformity with respect to  limit-emission spectral masks